In addition to the UHRTEM laboratory, a more standard TEM laboratory equipped with a high level uncorrected TEM (FEI TECNAI F30) and a more basic one (FEI TECNAI T20) has been set at the LMA. These equipments may be used by external users after few sessions of practice.
The basic T20 TEM is devoted to conventional experiments, such as the study of morphology, structure and particle size of nanomaterials.
The F30 is a high resolution microscope of much higher level. It allows imaging in TEM and STEM mode with a resolution of 1.9 Å and 1.38 Å, respectively, which can be combined with spectroscopy studies in EELS and EDX.
TEM and STEM tomography is also possible in order to perform 3D imaging of nanostructures.
Lastly, this microscope is fitted with a peculiar lens setting allowing the so-called Lorentz microscopy for magnetic materials. In that mode, the configuration of magnetic domains in nanomagnets can be studied.
Special TEM capabilities: